Electronic and atomic structure of amorphous thin films with high-resolution XPS: Examples of applications & limitations

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F13%3A39896251" target="_blank" >RIV/00216275:25310/13:39896251 - isvavai.cz</a>
Result on the web
<a href="http://www.sciencedirect.com/science/article/pii/S0022309313001300" target="_blank" >http://www.sciencedirect.com/science/article/pii/S0022309313001300</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.jnoncrysol.2013.02.030" target="_blank" >10.1016/j.jnoncrysol.2013.02.030</a>

Result language
angličtina
Original language name
Electronic and atomic structure of amorphous thin films with high-resolution XPS: Examples of applications & limitations
Original language description
The use of high resolution X-ray photoelectron spectroscopy to study chalcogenide glass thin films is analyzed. It is shown that the method is an effective tool to explore different chemical environments in the films and control chemical composition of the surface. Examples of the method applications such as kinetics study of induced silver dissolution in the thin films and investigation of oxidation on the surface of the thin film are presented. Limitations of the method are shown on the example of photoinduced structural transformations in chalcogenide glass thin films.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
CA - Inorganic chemistry
OECD FORD branch
—

Project
<a href="/en/project/GAP204%2F11%2F0832" target="_blank" >GAP204/11/0832: Fabrication of optical elements based on micro- and nanostructuring of chalcogenide layers</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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