Surface analysis, oxidation resistance, and embossing of Ge-based solution-processed thin films as materials for high refractive index optical elements
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F24%3A39921696" target="_blank" >RIV/00216275:25310/24:39921696 - isvavai.cz</a>
Result on the web
<a href="https://www.sciencedirect.com/science/article/pii/S0169433224014570" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0169433224014570</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.apsusc.2024.160744" target="_blank" >10.1016/j.apsusc.2024.160744</a>
Alternative languages
Result language
angličtina
Original language name
Surface analysis, oxidation resistance, and embossing of Ge-based solution-processed thin films as materials for high refractive index optical elements
Original language description
The solution-processing of chalcogenides offers a cheap route for potential mass production of high refractive index optical elements. Especially germanium-based glasses are perspective materials, but crucial information about their stability and patterning possibility was still missing. In this study, the Ge25S75, Ge20Sb5S75, Ge25Se75, and Ge20Sb5Se75 amorphous thin films were deposited in specular optical quality. The X-ray photoelectron spectroscopy (XPS) and Energy-dispersive X-ray spectroscopy (EDX) analysis revealed a significantly chalcogendepleted surface with metal over-stoichiometry, while the overall composition was still close to the targeted one. The oxidation resistance of studied samples was compared by their exposure to atmospheric conditions. The XPS proved that their resistance is strongly compositional dependent and rises as follows: Ge25S75 < Ge20Sb5S75 < Ge25Se75 < Ge20Sb5Se75. The analysis also showed the presence of amorphous thin layer of germanium oxides. The thin films were also utilized for the fabrication of diffraction gratings using a soft stamp hot embossing method. Samples were structured in a wide range of temperatures (with respect to T-g) and analyzed by atomic force microscopy (AFM) and EDX. Results demonstrated that selenides are more suitable for hot embossing as they provide gratings with higher depth and more stable composition, while sulfides exhibited significant chalcogen loss.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20506 - Coating and films
Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2024
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Surface Science
ISSN
0169-4332
e-ISSN
1873-5584
Volume of the periodical
672
Issue of the periodical within the volume
November 2024
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
18
Pages from-to
160744
UT code for WoS article
001279784000001
EID of the result in the Scopus database
2-s2.0-85199306104