Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F01%3APU21527" target="_blank" >RIV/00216305:26220/01:PU21527 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator
Original language description
The non-linearity and the noise of thick-film resistors are parameters that can be used to make prediction of resistor reliability. The noise spectroscopy measurements of thick-film resistors are proposed as a diagnostic tool for the prediction of possible types of failure. The correlation between noise spectral density datat and the results of accelerated aging of thick-film resistors at high temperature were made for HS80 and 2000 resistor pastes.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/ME%20244" target="_blank" >ME 244: Noise spectroscopy for quality and reliability asessment of thick film resistors</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microelectronics Reliability
ISSN
0026-2714
e-ISSN
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Volume of the periodical
41
Issue of the periodical within the volume
4
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
12
Pages from-to
531-542
UT code for WoS article
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EID of the result in the Scopus database
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