Noise in Passive Components - Resistors and Capacitors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU52211" target="_blank" >RIV/00216305:26220/02:PU52211 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Noise in Passive Components - Resistors and Capacitors
Original language description
The noise spectroscopy and non-linearity measurement of thick film resistors and tantalum and niobium capacitors is proposed as a non-destructive testing tool for quality and reliability prediction. The correlation between long-term stability and currentnoise and third harmonic index of thick film resistors prepared using two different technologies was investigated. The charge carrier transport and noise analysis of Ta2O5 and Nb2O5 dielectric layer capacitors was performed to find correlation between lleakage current and noise based quality indicators and optimize aging procedure
Czech name
Šum v pasivních součástkách - odporech a kondenzátorech
Czech description
The noise spectroscopy and non-linearity measurement of thick film resistors and tantalum and niobium capacitors is proposed as a non-destructive testing tool for quality and reliability prediction. The correlation between long-term stability and currentnoise and third harmonic index of thick film resistors prepared using two different technologies was investigated. The charge carrier transport and noise analysis of Ta2O5 and Nb2O5 dielectric layer capacitors was performed to find correlation between lleakage current and noise based quality indicators and optimize aging procedure
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the 13th Symposium on Advanced Materials
ISBN
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ISSN
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e-ISSN
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Number of pages
6
Pages from-to
110-115
Publisher name
Meisei University
Place of publication
Tokio
Event location
Meisei University, Tokyo, Japan
Event date
Nov 16, 2002
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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