Noise and non-linearity in passive components as reliability indicators

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU52210" target="_blank" >RIV/00216305:26220/02:PU52210 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Noise and non-linearity in passive components as reliability indicators
Original language description
The noise spectroscopy and non-linearity measurement of thick film resistors and tantalum and niobium capacitors is proposed as a non-destructive testing tool for quality and reliability prediction. The correlation between long-term stability and currentnoise and third harmonic index of thick film resistors prepared using two different technologies was investigated. The charge carrier transport and noise analysis of Ta2O5 and Nb2O5 dielectric layer capacitors was performed to find correlation between lleakage current and noise based quality indicators and optimize aging procedure
Czech name
Šum a nelinearita pasivních součástek jako indikátory spolehlivosti
Czech description
The noise spectroscopy and non-linearity measurement of thick film resistors and tantalum and niobium capacitors is proposed as a non-destructive testing tool for quality and reliability prediction. The correlation between long-term stability and currentnoise and third harmonic index of thick film resistors prepared using two different technologies was investigated. The charge carrier transport and noise analysis of Ta2O5 and Nb2O5 dielectric layer capacitors was performed to find correlation between lleakage current and noise based quality indicators and optimize aging procedure

Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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