Influence of Functional Resistors on Offset Voltage Noise in Thick-Film Pressure Sensors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU101130" target="_blank" >RIV/00216305:26220/12:PU101130 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Influence of Functional Resistors on Offset Voltage Noise in Thick-Film Pressure Sensors
Original language description
We are concentrating our effort on the investigation of Low-Temperature Co-fired Ceramic (LTCC)-based ceramic pressure sensors (CPSs) quality and reliability using the low frequency noise measurements. Special test specimens containing thick film resistors of different sizes including four thick-film resistors (0.8 x 0.8 mm2) connected in the Wheatstone bridge were made for the case study by using different thick-film materials and technology variants. In the present work we will discuss the correlationbetween the functional resistor parameters (resistance and layer thickness, respectively) and the noise level of single resistors, as well as the correlation between the bridge offset voltage fluctuation and the noise of single resistors within the bridge. For given sample geometry the sample resistance increases with decreasing thickness of the resistive layer. Thinner resistors have smaller volume of resistive layer which leads to the increase of 1/f noise component. The discussion ho
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/MEB091129" target="_blank" >MEB091129: Investigation of the noise of thick-film pressure sensors</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
MIDEM Society for Microelectronic, Electronic Components and Materials - Conference 2012 Proceedings
ISBN
978-961-92933-2-4
ISSN
—
e-ISSN
—
Number of pages
6
Pages from-to
393-398
Publisher name
MIDEM
Place of publication
Slovinsko
Event location
Otočec Slovenia
Event date
Sep 19, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
—