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Non-linearity and noise characterisation of thick-film resistors after high voltage stress

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F04%3APU45391" target="_blank" >RIV/00216305:26220/04:PU45391 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Non-linearity and noise characterisation of thick-film resistors after high voltage stress

  • Original language description

    Experimental investigation on cermet thick film resistors shows, that non-linearity and 1/f noise spectral density is changed after high voltage stressing. Stressing method is based on the short current pulse from capacitor discharge. In the thick film resistor the current is flying through conductive chains composed of conducting grains and filaments separated by thin insulating layer. It is supposed, that multi-spot contact is created between contact and resistive layer. Non-linearity and noise spectrral voltage density were measured before and after high voltage stress. Two mechanisms were observed. (i) Sample resistance, non-linearity and noise decreases after high voltage stressing. We suppose, that the effect of resistance, non-linearity and noise lowering is caused by filaments fritting. During this process thin isolating film between metallic grains is either doped or shorted. (ii) Sample resistance, non-linearity and noise increases after high voltage stressing. We suppose tha

  • Czech name

    Vyhodnocení kvality tlustovrstvových odporů pomocí měření šumu a nelinearity po namáhání vysokonapěťovým pulsem

  • Czech description

    Experimental investigation on cermet thick film resistors shows, that non-linearity and 1/f noise spectral density is changed after high voltage stressing. Stressing method is based on the short current pulse from capacitor discharge. In the thick film resistor the current is flying through conductive chains composed of conducting grains and filaments separated by thin insulating layer. It is supposed, that multi-spot contact is created between contact and resistive layer. Non-linearity and noise spectrral voltage density were measured before and after high voltage stress. Two mechanisms were observed. (i) Sample resistance, non-linearity and noise decreases after high voltage stressing. We suppose, that the effect of resistance, non-linearity and noise lowering is caused by filaments fritting. During this process thin isolating film between metallic grains is either doped or shorted. (ii) Sample resistance, non-linearity and noise increases after high voltage stressing. We suppose tha

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/ME%20605" target="_blank" >ME 605: Noise of HEMT for global communication</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2004

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 3rd European Microelectronics and Packaging Symposium with Table Top Exhibition

  • ISBN

    80-239-2835-X

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    421-426

  • Publisher name

    IMAPS CZ&SK Chapter

  • Place of publication

    Lanskroun

  • Event location

    Prague

  • Event date

    Jun 16, 2004

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article