Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU30294" target="_blank" >RIV/00216305:26220/02:PU30294 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity
Original language description
The noise spectroscopy measurement and third harmonic testing was used to investigate effect of the contact electrode geometry and material composition on the thick film resistor quality. It was proved experimentally that noise spectral density is proportional to electric field intensity, while third harmonic voltage depends on the third power of electric field intensity or current density. Modelling of the current distribution for two different shapes of metallic contact cross sections was performed. TThe electrode geometry plays dominant role for current distribution. The lower value of metallic contact angle, the higher current density peak appears in the vicinity of the contact edge. Effect of cracks, which are found near the contact electrode, also play important role in current distribution, noise sources and non-linearity.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/ME%20244" target="_blank" >ME 244: Noise spectroscopy for quality and reliability asessment of thick film resistors</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proc. of 38th International Conference on Microelectronics, Devices and Materials
ISBN
961-91023-0-4
ISSN
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e-ISSN
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Number of pages
7
Pages from-to
245-251
Publisher name
Neuveden
Place of publication
Lipica, Slonenia
Event location
Lipica
Event date
Oct 9, 2002
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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