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NDT of thick film resistors by noise spectroscopy

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU30731" target="_blank" >RIV/00216305:26220/02:PU30731 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    NDT of thick film resistors by noise spectroscopy

  • Original language description

    The noise spectroscopy measurements of thick-film resistors are proposed as a non-destructive testing method for the quality and reliability prediction and possible types of failure evaluation. The thick-film layer structure consists of metallic grains and inter-grain glass layers. Junctions between the metallic grains and glass layers are sources of noise and non-linearity. Important sources of noise are in the vicinity of defects and in the contact region. The main advantages of a noise testing are hiigher sensitivity than DC measurements during life tests. The kinds of noise spectra in view of reliability diagnostic are mainly the typical poor-device indicators like burst noise, generation-recombination noise, 1/f noise, and the 1/fa noise. The non-linearity of the thick-film layer structure is proportional to the distortion of the pure harmonic signal applied to the sample, and is connected with physical anomalies. The noise spectroscopy and non-linearity NDT can be used to adjust

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/ME%20244" target="_blank" >ME 244: Noise spectroscopy for quality and reliability asessment of thick film resistors</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2002

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of 8th ECNDT

  • ISBN

    84-699-8573-6

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    215-220

  • Publisher name

    Spanish Society for NDT AEND

  • Place of publication

    Leganes, Madrid

  • Event location

    Madrid

  • Event date

    Jun 17, 2002

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article