Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU39196" target="_blank" >RIV/00216305:26220/03:PU39196 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—

Result language
angličtina
Original language name
Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors
Original language description
Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose tthe theoretical model of NbO - Nb2O5 - MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor andlimits the current bellow the capacitor's thermal runaway point, which prevents capacitor's burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide
Czech name
—
Czech description
—

Project
<a href="/en/project/ME%20605" target="_blank" >ME 605: Noise of HEMT for global communication</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Similar results(10)