Breakdown characteristics and low frequency noise of niobium based capacitors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU40393" target="_blank" >RIV/00216305:26220/03:PU40393 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Breakdown characteristics and low frequency noise of niobium based capacitors
Original language description
New capacitor technologies based on Niobium (Nb)and Niobium Oxide (NbO) powders in conjunction with niobium pentoxide (Nb2O5) dielectric have been released recently. These technologies are based on processes nearly identical to those of conventional tantalum (Ta) capacitors. One of the key features of the NbO, in contrast to Nb and Ta, is its' high resistance to ignition. This is due to the intrinsically higher ignition energy of NbO material and higher resistance failure mode after dielectric breakdownn. This paper describes the behaviour of NbO capacitors after forced dielectric breakdown with both forward and reverse voltages applied. A low frequency analysis of the charge carrier transport mechanism has been performed on the Nb/NbO - Nb2O5 - MnO2 systems and the mechanisms governing current flow and noise sources have been determined. The ideal metal / insulator / semiconductor (MIS) structure is shown in Fig.1. This paper also reviews the basic features of these capacitor technolo
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Capacitor and Resistor Technology
ISSN
0887-7491
e-ISSN
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Volume of the periodical
2003
Issue of the periodical within the volume
4
Country of publishing house
US - UNITED STATES
Number of pages
7
Pages from-to
53-59
UT code for WoS article
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EID of the result in the Scopus database
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