Noise and Non-linearity as Reliability Indicators of Electronic Devices
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU39212" target="_blank" >RIV/00216305:26220/03:PU39212 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26220/03:PU40344
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Noise and Non-linearity as Reliability Indicators of Electronic Devices
Original language description
An aplication of noise and non-linearity measurements in analysis, diagnostic and prediction of reliability of electronic devices is discussed. The sensitivity of noise and non-linearity to the device defects and other irregularities is typicaly featureof these methods. Conceptions of 1/f noise, burst noise or RTS noise, thermal noise and third harmonic voltage are described and theirs explanation is done. The results of noise and non-linearity measurements are shown. Possible reliability indicators foor conducting film resistors, MOSFETs and quantum dots are presented.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/ME%20605" target="_blank" >ME 605: Noise of HEMT for global communication</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
MIDEM Cenference 2003 Proceedings
ISBN
961-91023-1-2
ISSN
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e-ISSN
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Number of pages
12
Pages from-to
3-14
Publisher name
MIDEM - Society for Microelectronics, Electronic components and Materials
Place of publication
Slovenia
Event location
Ptuj
Event date
Oct 1, 2003
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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