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Optimizing of Solder Joint Reliability by 3D Modeling

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F04%3APU43642" target="_blank" >RIV/00216305:26220/04:PU43642 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Optimizing of Solder Joint Reliability by 3D Modeling

  • Original language description

    This article is focused on thermo-mechanical modelling of solder joint between two materials with different CTE, which are commonly used in many today?s electronic devices. There are investigated various materials including most common combination FR4 and 96% Al2O3 ceramic materials. The substrates are connected with lead free solder composition SnAgCu. ANSYS software is applied and results from several analyse combinations are discussed. One of the main purposes is a comparison of thermo-mechanical prooperties such as stress and strain that can creates in MSMs, when lead free solder bumps changed their dimensions and shape by thermal loading.

  • Czech name

    Optimalizace spolehlivosti pajenych spoju pomoci 3D modelovani

  • Czech description

    Příspěvek je zaměřen na termomechaniké modelování dvou substrátů s různým CTE. Jedním z materiálů je laminát FR4, druhým je keramika 96% Al2O3. Spojení substrátů je zajištěno pomocí spojů realizovaných bezolovnatou pájkou SnAgCu. Cílem je popsat vliv rozměrů a tvaru pájených spojů na mechanické napětí v struktuře vznikající.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA102%2F04%2F0590" target="_blank" >GA102/04/0590: Development of microelectronics technologies for 3D circuits and systems</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2004

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of 3rd Microelectronics and Packaging Symposium with Table Top Exhibition

  • ISBN

    80-239-2835-X

  • ISSN

  • e-ISSN

  • Number of pages

    200

  • Pages from-to

    195-394

  • Publisher name

    IMAPS CZ&SK Chapter

  • Place of publication

    Lanskroun

  • Event location

    Prague

  • Event date

    Jun 16, 2004

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article