Application of CBCM Method to Nonlinear Capacitor Characterization
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F04%3APU44099" target="_blank" >RIV/00216305:26220/04:PU44099 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
čeština
Original language name
Application of CBCM Method to Nonlinear Capacitor Characterization
Original language description
The paper deals with an application of the CBCM method (Charge-Based Capacitance Measurements) to nonlinear capacitance characterization. Since its invention the CBCM method has been extensively used for on-chip interconnect linear capacitance measurements. However, it can be also used for nonlinear device characterization. Application of CBCM to 0.35-um CMOS gate-capacitance measurements is presented.
Czech name
Application of CBCM Method to Nonlinear Capacitor Characterization
Czech description
The paper deals with an application of the CBCM method (Charge-Based Capacitance Measurements) to nonlinear capacitance characterization. Since its invention the CBCM method has been extensively used for on-chip interconnect linear capacitance measurements. However, it can be also used for nonlinear device characterization. Application of CBCM to 0.35-um CMOS gate-capacitance measurements is presented.
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GD102%2F03%2FH105" target="_blank" >GD102/03/H105: Modern methods of electronic circuit analysis, design and applications</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2004
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
International Conference on Signals and Electronic Systems
ISBN
83-906074-7-6
ISSN
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e-ISSN
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Number of pages
3
Pages from-to
119-121
Publisher name
Poznan University of Technology, PTETiS
Place of publication
Poznan
Event location
Poznaň
Event date
Sep 13, 2004
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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