Characterization of Nonlinear On-Chip Capacitors

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F07%3APU68095" target="_blank" >RIV/00216305:26220/07:PU68095 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Characterization of Nonlinear On-Chip Capacitors
Original language description
The paper deals with nonlinear on-chip capacitor characterization. A modification of CBCM (Charge-Based Capacitance Measurements) has been proposed. The CBCM method was originally developed for linear interconnect-capacitance measurements. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the measured object. The main advantage of the method is high resolution although it is based on equipment found inany average laboratory. A test-chip implementing the method was designed and manufactured in 0.35m CMOS process. Verification against known capacitances proved the method correctness and accuracy. The test-chip was successfully used for MOSFET gate-capacitance characterization.
Czech name
Charakterizace nelineárních kapacitorů na čipu
Czech description
Článek pojednává o charakterizaci nelineárních kapacitorů na čipu

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2007
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 17th International Conference Radioelektronka 2007
ISBN
1-4244-0821-0
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
51-55
Publisher name
Brno University of Technology
Place of publication
Brno
Event location
Brno
Event date
Apr 24, 2007
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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