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C-V Characterization of Nonlinear Capacitors Using CBCM Method

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F07%3APU68093" target="_blank" >RIV/00216305:26220/07:PU68093 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    C-V Characterization of Nonlinear Capacitors Using CBCM Method

  • Original language description

    The paper deals with a modification of CBCM (Charge-Based Capacitance Measurements) for nonlinear capacitance characterization. The method is characterized by high resolution although it is based on equipment found in any average laboratory. CBCM was originally developed for linear interconnect measurements. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the measured object. A test-chip implementingthe method was designed and manufactured in 0.35&#956;m CMOS process. Verification against known capacitances proved the method correctness and accuracy. It was successfully used for MOSCAPs characterization in full operating voltage range.

  • Czech name

    Charakterizace nelineárních kondenzátorů metodou CBCM

  • Czech description

    Článek pojednává o charakterizaci nelineárních kondenzátorů metodou CBCM

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2007

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 14th International Conference Mixed Design of Integrated Circuits and Systems 2007

  • ISBN

    83-922632-9-4

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    501-505

  • Publisher name

    Technical University of Lodz

  • Place of publication

    Lodž, Poland

  • Event location

    Ciechocinek

  • Event date

    Jun 21, 2007

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article