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Control of Dynamics of SPM Probes for Non-destructive defectoscopy

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU48731" target="_blank" >RIV/00216305:26220/05:PU48731 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Control of Dynamics of SPM Probes for Non-destructive defectoscopy

  • Original language description

    Paper describes a control of dynamics of Scanning Probe Microscopy (SPM) and especially STM microscope probes, which are going to be used for non-destructive defectoscopy on surface and subsurface layers of material with nanometer resolution. STM microscope is based on an electron tunnel effect. The tunnel effect proceeds between a probe and a tested sample, where a probe disturbs so called near-field of the material. A principle of STM microscope allows get an information only from material spot whichis just under the probe. Therefore have to be used a manipulator to move with the sample under probe to scan whole surface of the material. The piezonanomanipulator is necessary to this movement, this instrument provide movement under the probe with high accuracy of few nanometers. The nanomanipulator can move itself in 3 axis x,y,z, a movement is realized by the help of piezo-crystals, these are feeding by the voltage from &#61485;2 to +12 V. Paper is focused on the quality of used nan

  • Czech name

    Řízení dynamiky sond SPM v nedestruktivní defektoskopii

  • Czech description

    V článku je popsáno řízení dynamiky sondy pro SPM mikroskopy, speciálně pro STM, které se používají pro nedestruktivní testování nanostruktury materiálů. Dále je zde popsán tunelový jev, jako jeden ze základů kvantové mechaniky. Článek se také zabývá nanomanipulátorem pro pohyb prvku pod sondou přístroje. Popisuje jeho základní vlastnosti a zkoumá použitelnost tohoto přístroje pro metody STM.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2005

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of XXXth Seminary XXX ASR'05:Instruments and Control '05

  • ISBN

    80-248-0774-2

  • ISSN

  • e-ISSN

  • Number of pages

    8

  • Pages from-to

    30-37

  • Publisher name

    VŠB TU Ostrava

  • Place of publication

    Ostrava

  • Event location

    Ostrava

  • Event date

    Apr 30, 2004

  • Type of event by nationality

    CST - Celostátní akce

  • UT code for WoS article