Charge Carrier Transport in Polymer-Based Thick Resistive Films

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU52121" target="_blank" >RIV/00216305:26220/05:PU52121 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Charge Carrier Transport in Polymer-Based Thick Resistive Films

Original language description

We proposed the model for the charge carrier transport in the polymer based thick film structures. The model is based on the assumption that the electric charge transport is due to the electron tunnelling through the barrier between carbon and graphite particles. The main noise and non-linearity sources in polymer based thick film layer are considered to be the contacts between conducting grains. On the basis of this model the sheet resistance and effective number of electrons acting as mobility fluctuaators in one point contact can be calculated. From the low frequency noise measurements we can estimate the number of point contacts in the thick film resistive layer. The influence of the polymer vehicle and thermal treatment on the thick film structureis characterized by noise and nonlinearity measurements. During the thermal treatment the conductivity of the resistive layer is changed due to the change of number of contacts between conducting grains - the distance between conducting g

Czech name

Transport náboje v tlustých vrstvách na bázi polymerů

Czech description

We proposed the model for the charge carrier transport in the polymer based thick film structures. The model is based on the assumption that the electric charge transport is due to the electron tunnelling through the barrier between carbon and graphite particles. The main noise and non-linearity sources in polymer based thick film layer are considered to be the contacts between conducting grains. On the basis of this model the sheet resistance and effective number of electrons acting as mobility fluctuaators in one point contact can be calculated. From the low frequency noise measurements we can estimate the number of point contacts in the thick film resistive layer. The influence of the polymer vehicle and thermal treatment on the thick film structureis characterized by noise and nonlinearity measurements. During the thermal treatment the conductivity of the resistive layer is changed due to the change of number of contacts between conducting grains - the distance between conducting g

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2005

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Capacitor and Resistor Technology

ISSN

0887-7491

e-ISSN

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Volume of the periodical

2005

Issue of the periodical within the volume

10

Country of publishing house

US - UNITED STATES

Number of pages

6

Pages from-to

93-98

UT code for WoS article

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EID of the result in the Scopus database

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