Dynamic testing of solar cells
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU54519" target="_blank" >RIV/00216305:26220/05:PU54519 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
čeština
Original language name
Dynamické testování solárních článků.
Original language description
Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The measurement and evaluation procedure is very simple and no expensive devices are needed. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily. To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 - 500 mV was used. The voltage bias was madde with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed.
Czech name
Dynamické testování solárních článků.
Czech description
Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The measurement and evaluation procedure is very simple and no expensive devices are needed. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily. To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 - 500 mV was used. The voltage bias was madde with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed.
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Mikrosyn. Nové trendy v mikroelektronických systémech a nanotechnologiích. Sborník seminare
ISBN
80-214-3116-4
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
168-173
Publisher name
Nakl. Novotný
Place of publication
Brno
Event location
Brno
Event date
Dec 12, 2005
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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