Investigation of 1/f Noise of p-type CdTe Detectors

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F07%3APU67898" target="_blank" >RIV/00216305:26220/07:PU67898 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Investigation of 1/f Noise of p-type CdTe Detectors

Original language description

This paper presents the results of experimental studies of transport and noise characteristics of CdTe single crystals. Though no universal mechanism has been identified for flicker noise or 1/f noise, it is the most ubiquitous form of noise in nature. Phenomena that have no obvious connection like heartbeat, cell membrane potential, financial data, DNA sequences and transistors exhibit fluctuations with a 1/f character. As the term "1/f" suggests, a spectral density that increases without limit as frequency decreases, characterizes this kind of noise. Flicker noise in the CdTe single crystals was studied. Two CdTe detectors were used; both have p-type conductivity. One of them has low-ohmic contacts (F33B8), another one have high-ohmic contact (452D).

Czech name

1/f Šum v CdTe detektorech p-typu

Czech description

This paper presents the results of experimental studies of transport and noise characteristics of CdTe single crystals. Though no universal mechanism has been identified for flicker noise or 1/f noise, it is the most ubiquitous form of noise in nature. Phenomena that have no obvious connection like heartbeat, cell membrane potential, financial data, DNA sequences and transistors exhibit fluctuations with a 1/f character. As the term "1/f" suggests, a spectral density that increases without limit as frequency decreases, characterizes this kind of noise. Flicker noise in the CdTe single crystals was studied. Two CdTe detectors were used; both have p-type conductivity. One of them has low-ohmic contacts (F33B8), another one have high-ohmic contact (452D).

Type

D - Article in proceedings

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

<a href="/en/project/GA102%2F07%2F0113" target="_blank" >GA102/07/0113: Noise as Diagnostic Tool for Schottky and Could Electron Emission Cathodes</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2007

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

30th International Spring Seminar on Electronics Technology 2007

ISBN

978-973-713-174

ISSN

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e-ISSN

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Number of pages

2

Pages from-to

88-89

Publisher name

Dan Pitica

Place of publication

Cluj-Napoca, Romania

Event location

Cluj-Napoca

Event date

May 9, 2007

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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