Investigation of 1/f Noise Sources in CdTe Radiation Detectiors

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F07%3APU70066" target="_blank" >RIV/00216305:26220/07:PU70066 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Investigation of 1/f Noise Sources in CdTe Radiation Detectiors
Original language description
Low frequency noise of CdTe radiation detectors was measured and analyzed. Two CdTe detectors were used for the measurements. Both detectors have p-type conductivity. One of them has low-ohmic contacts (F33B8), another one have high-ohmic contact (452D).The value of flicker noise for both detectors was much higher than theoretical value for CdTe single crystals. Analysis shows that the contact area is the source of extra high low frequency noise value.
Czech name
Vyzkum sumu 1/f v CdTe detektorech
Czech description
Low frequency noise of CdTe radiation detectors was measured and analyzed. Two CdTe detectors were used for the measurements. Both detectors have p-type conductivity. One of them has low-ohmic contacts (F33B8), another one have high-ohmic contact (452D).The value of flicker noise for both detectors was much higher than theoretical value for CdTe single crystals. Analysis shows that the contact area is the source of extra high low frequency noise value.

Project
<a href="/en/project/GA102%2F06%2F1551" target="_blank" >GA102/06/1551: Diagnostics of PN junction electronic devices by means of microplasma noise evaluation</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2007
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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