Experimental Analysis of Noise in CdTe Radiation Detectors

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F09%3A00206854" target="_blank" >RIV/00216208:11320/09:00206854 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Experimental Analysis of Noise in CdTe Radiation Detectors

Original language description

Noise characteristics of CdTe gamma and X-ray detectors have been carried out. Measurements of high-ohmic detectors with two golden contacts and low-ohmic detectors with four contacts were carried out. Two voltage contacts were used to distinguish between metal-semiconductor junction area with depleted region and homogeneous part of the sample. The noise characteristics of the samples were measured in dark and with the illumination in the range of radiation from ultraviolet to infrared.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

<a href="/en/project/GA102%2F09%2F1920" target="_blank" >GA102/09/1920: Stochastic Phenomena in MIS and MIM Semiconductor Structures</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

AIP Conference Proceedings

ISBN

978-0-7354-0665-0

ISSN

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e-ISSN

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Number of pages

4

Pages from-to

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Publisher name

American Institute of Physics

Place of publication

Melville, New York

Event location

Melville, New York

Event date

Jan 1, 2009

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

000267057200073