Alternating current thin film electroluminescent device characterization
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU74279" target="_blank" >RIV/00216305:26220/08:PU74279 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Alternating current thin film electroluminescent device characterization
Original language description
The objective of this thesis is to study the optical and electrical characterization of Alternating-Current Thin-Film ElectroLuminescent (ACTFEL) devices, and specifically the aging process of phosphor materials that comprise the ACTFEL display in an effort to improve the overall performance of the primary phosphor colors in terms of brightness, efficiency and stability. The study of the aging characteristics of evaporated and atomic layer epitaxy ZnS:Mn phosphors has been undertaken by monitoring the luminance-voltage (L-V) internal charge-phosphor field (Q-Fp) and capacitance-voltage (C-V) electrical characteristics at in selected time intervals during aging. Short-term and long-term ACTFEL aging studies has been provided and an attempt to visualizelocally the structure of phosphor with a subwavelenght resolution using Scanning near-field optical microscope (SNOM) has also been presented. The practical case of a green Zn2GeO4:Mn (2% Mn) ACTFEL device operated at 50 Hz has been studi
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F08%2F1474" target="_blank" >GA102/08/1474: Local optical and electronic characterisation of optoelectronic structures with nanometric resolution</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů