Noise Reliability Indicators In SMT Chip Resistors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU74379" target="_blank" >RIV/00216305:26220/08:PU74379 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Noise Reliability Indicators In SMT Chip Resistors
Original language description
The possible exploitation of low frequency noise and non-linearity measurements for thin film resistor characterisation is presented. The low frequency noise spectrum is 1/fa type and it is due to two sources: fundamental quantum 1/f noise and excess 1/fnoise. It is fre-quently observed that excess 1/f noise is related to the microscopic sample structure and the manufacturing technology. The non-linearity of A-V characteristic is proportional to the dis-tortion of pure harmonic signal applied to the measured sample. Carrier transport in thin re-sistive layers is not strictly linear and the third harmonic voltage is proportional to the third power of electric field intensity or current density.
Czech name
Noise Reliability Indicators In SMT Chip Resistors
Czech description
The possible exploitation of low frequency noise and non-linearity measurements for thin film resistor characterisation is presented. The low frequency noise spectrum is 1/fa type and it is due to two sources: fundamental quantum 1/f noise and excess 1/fnoise. It is fre-quently observed that excess 1/f noise is related to the microscopic sample structure and the manufacturing technology. The non-linearity of A-V characteristic is proportional to the dis-tortion of pure harmonic signal applied to the measured sample. Carrier transport in thin re-sistive layers is not strictly linear and the third harmonic voltage is proportional to the third power of electric field intensity or current density.
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F06%2F0866" target="_blank" >GA102/06/0866: Nonlinear electroultrasonic spectroscopy of solids</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Student EEICT 2008 Proceedings Of The 14th Conference
ISBN
978-80-214-3617-6
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
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Publisher name
Ing. Zdeněk Novotný CSc.
Place of publication
Ondráčkova 105 Brno
Event location
FEKT VUT v Brně
Event date
Apr 24, 2008
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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