Effective defect identifications in honeycombs

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU74520" target="_blank" >RIV/00216305:26220/08:PU74520 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Effective defect identifications in honeycombs

Original language description

The image reconstruction problem based on Electrical Impedance Tomography (EIT) is an ill-posed inverse problem of finding such conductivity distribution that minimizes some optimisation criterion, which can be given by a suitable primal objective function. This paper describes new algorithms for the reconstruction of the surface conductivity distribution, which are based on stochastic methods to be used for the acquirement of more accurate reconstruction results and stable solution. The proposed methods are expected to non-destructive test of materials. There are shown examples of the identification of voids or cracks in special structures called honeycombs. Instead of the experimental data we used the phantom evaluated voltage values based on the application of finite element method. The results obtained by this new approach are compared with results from the known deterministic approach to the same image reconstruction.

Czech name

Efektivní identifikace defektů ve strukturach honeycombs

Czech description

The image reconstruction problem based on Electrical Impedance Tomography (EIT) is an ill-posed inverse problem of finding such conductivity distribution that minimizes some optimisation criterion, which can be given by a suitable primal objective function. This paper describes new algorithms for the reconstruction of the surface conductivity distribution, which are based on stochastic methods to be used for the acquirement of more accurate reconstruction results and stable solution. The proposed methods are expected to non-destructive test of materials. There are shown examples of the identification of voids or cracks in special structures called honeycombs. Instead of the experimental data we used the phantom evaluated voltage values based on the application of finite element method. The results obtained by this new approach are compared with results from the known deterministic approach to the same image reconstruction.

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2008

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Advances in Electrical and Electronic Engineering

ISSN

1336-1376

e-ISSN

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Volume of the periodical

08

Issue of the periodical within the volume

7

Country of publishing house

SK - SLOVAKIA

Number of pages

406

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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