Identification of Defects in Materials with Surface Conductivity Distribution

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU73838" target="_blank" >RIV/00216305:26220/08:PU73838 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Identification of Defects in Materials with Surface Conductivity Distribution

Original language description

The images of the electrical surface conductivity distribution can be reconstructed from the voltage measurement captured on the boundaries of an object. This very well known technique is named Electrical Impedance Tomography. The image reconstruction problem is an ill-posed inverse problem of finding such conductivity that minimizes some optimisationcriterion, which can be given by a suitable primal objective function. This paper describes new algorithms based on stochastic methods to be used for the acquirement of more accurate reconstruction results and stable solution. The proposed methods are expected to non-destructive test of materials. It will be shown examples of the identi?cation of voids or cracks in special structures called honeycombs. Instead of the experiments we used phantom evaluated voltage values based on the application of ?nite element method. The advantages of a new approach are compared with properties of a deterministic approach to the same image reconstructions

Czech name

Identification of Defects in Materials with Surface Conductivity Distribution

Czech description

The images of the electrical surface conductivity distribution can be reconstructed from the voltage measurement captured on the boundaries of an object. This very well known technique is named Electrical Impedance Tomography. The image reconstruction problem is an ill-posed inverse problem of finding such conductivity that minimizes some optimisationcriterion, which can be given by a suitable primal objective function. This paper describes new algorithms based on stochastic methods to be used for the acquirement of more accurate reconstruction results and stable solution. The proposed methods are expected to non-destructive test of materials. It will be shown examples of the identi?cation of voids or cracks in special structures called honeycombs. Instead of the experiments we used phantom evaluated voltage values based on the application of ?nite element method. The advantages of a new approach are compared with properties of a deterministic approach to the same image reconstructions

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2008

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

PIERS ONLINE

ISSN

1931-7360

e-ISSN

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Volume of the periodical

4

Issue of the periodical within the volume

1

Country of publishing house

US - UNITED STATES

Number of pages

5

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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