Image Reconstruction Using Combination Deterministic and Stochastic Method

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU71369" target="_blank" >RIV/00216305:26220/08:PU71369 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Image Reconstruction Using Combination Deterministic and Stochastic Method

Original language description

This paper proposes a new algorithm based on the combination of deterministic and stochastic methods to be used to obtain the best results of a reconstruction process of the surface conductivity distribution. The images of the electrical surface conductivity distribution can be reconstructed from voltage measurement captured on the boundaries of an object. The image reconstruction problem is an ill-posed inverse problem of finding such surface conductivity that minimizes the suitable optimisation criterion. The advantages of a new approach are compared with properties of deterministic and stochastic approaches during the same image reconstructions. It will be shown that proposed algorithm is a very effective way to obtain the satisfying identificationof cracks in special structures called honeycombs.

Czech name

Rekonstrukce obrazu s využitím kombinace deterministické a stochastické metody

Czech description

This paper proposes a new algorithm based on the combination of deterministic and stochastic methods to be used to obtain the best results of a reconstruction process of the surface conductivity distribution. The images of the electrical surface conductivity distribution can be reconstructed from voltage measurement captured on the boundaries of an object. The image reconstruction problem is an ill-posed inverse problem of finding such surface conductivity that minimizes the suitable optimisation criterion. The advantages of a new approach are compared with properties of deterministic and stochastic approaches during the same image reconstructions. It will be shown that proposed algorithm is a very effective way to obtain the satisfying identificationof cracks in special structures called honeycombs.

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2008

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

PIERS ONLINE

ISSN

1931-7360

e-ISSN

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Volume of the periodical

Vol. 45

Issue of the periodical within the volume

1

Country of publishing house

US - UNITED STATES

Number of pages

4

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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