Combination of deterministic and stochastic approaches to the image reconstruction

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU74521" target="_blank" >RIV/00216305:26220/08:PU74521 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Combination of deterministic and stochastic approaches to the image reconstruction

Original language description

In this paper is described a new algorithm based on the combination of deterministic and stochastic approaches to the reconstruction process of the surface conductivity distribution to obtain the best results. The images of the electrical surface conductivity distribution can be reconstructed from voltage measurement captured on the boundaries of an object. The image reconstruction problem is an ill-posed inverse problem of finding such surface conductivity that minimizes the suitable optimisation criterion. The advantages of a new approach are compared with properties of deterministic and stochastic approaches during the same image reconstructions. It will be shown that proposed algorithm is a very effective way to obtain the satisfying identificationof cracks in special structures called honeycombs.

Czech name

Kombinace deterministických a stochastických metod pro rekonstrukci obrazu

Czech description

In this paper is described a new algorithm based on the combination of deterministic and stochastic approaches to the reconstruction process of the surface conductivity distribution to obtain the best results. The images of the electrical surface conductivity distribution can be reconstructed from voltage measurement captured on the boundaries of an object. The image reconstruction problem is an ill-posed inverse problem of finding such surface conductivity that minimizes the suitable optimisation criterion. The advantages of a new approach are compared with properties of deterministic and stochastic approaches during the same image reconstructions. It will be shown that proposed algorithm is a very effective way to obtain the satisfying identificationof cracks in special structures called honeycombs.

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2008

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Advances in Electrical and Electronic Engineering

ISSN

1336-1376

e-ISSN

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Volume of the periodical

08

Issue of the periodical within the volume

7

Country of publishing house

SK - SLOVAKIA

Number of pages

406

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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