Microplasma noise sources and noise spectroscopy analyzing

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU75405" target="_blank" >RIV/00216305:26220/08:PU75405 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—

Result language
angličtina
Original language name
Microplasma noise sources and noise spectroscopy analyzing
Original language description
This paper deals with comparisons of noise spectroscopy and detection of microplasma noise sources in the three new type of solar cells G1, G3 and G5. When high electric is applied to PN junction with some technological imperfections like dislocation inPN junction or crystal-grid defect causing non-homogeneity of parameters it produces in tiny areas of enhanced impact ionization called microplasma. It can leads onwards to deterioration in quality or to destruction of PN junction. Microplasma produced noise, which has random spectrum in frequency range. Microplasma noise is measurable even before the creation of light emissions. Due to the comparisons microplasma detection with noise characteristic can full analyzed solar cell.
Czech name
Analýza zdrojů mikroplazmy a šumová spektroskopie
Czech description
Práce se zabývá porovnáním spektrální analýzy šumu a detekce zdrojů šumu mikroplasmy ve třech nových typech solárních článků G1, G3 a G5.

Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
EDS 08 IMAPS CS INTERNATIONAL CONFERENCE PROCEEDINGS
ISBN
978-80-214-3717-3
ISSN
—
e-ISSN
—
Number of pages
9
Pages from-to
—
Publisher name
Vysoké učení technické v Brně
Place of publication
Brno
Event location
Brno
Event date
Sep 10, 2008
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
—

Similar results(10)