Diagnostics of Forward Biased Silicon Solar Cells Using Noise Spectroscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU82313" target="_blank" >RIV/00216305:26220/09:PU82313 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Diagnostics of Forward Biased Silicon Solar Cells Using Noise Spectroscopy

Original language description

Our research is above all focused on non-destructive testing of the solar cells. We study a single-crystal silicon solar cells n+p and we don't have serious information about features of a pn junction and impurities distribution. The main point of our study is characterization of the local defects in samples. These defects lead to live-time reduction and degradation of reliability. Flicker noise in forward biased solar cells is subject of this paper. We will discuss our measurement with Kleinpenning approaches for inhomogeneous semiconductors and we suggest the physical nature of the samples behaviour.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GD102%2F09%2FH074" target="_blank" >GD102/09/H074: Diagnostics of material defects using the latest defectoscopic methods</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

AIP conference proceedings

ISSN

0094-243X

e-ISSN

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Volume of the periodical

1129

Issue of the periodical within the volume

1

Country of publishing house

US - UNITED STATES

Number of pages

4

Pages from-to

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UT code for WoS article

000267057200035

EID of the result in the Scopus database

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