Scintillation secondary electron detector for variable pressure scanning electron microscope
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU86601" target="_blank" >RIV/00216305:26220/10:PU86601 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Scintillation secondary electron detector for variable pressure scanning electron microscope
Original language description
This work deals with optimalization of the electrode system of the experimental secondary electron detector for variable pressure sem for different pressure of vater vapours in the specimen chamber.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the 16th conference student EEICT 2010
ISBN
978-80-214-4079-1
ISSN
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e-ISSN
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Number of pages
250
Pages from-to
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Publisher name
Neuveden
Place of publication
Brno
Event location
FEKT VUT v Brně
Event date
Apr 29, 2010
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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