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Scintillation secondary electron detector for VP-SEM

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU92072" target="_blank" >RIV/00216305:26220/11:PU92072 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Scintillation secondary electron detector for VP-SEM

  • Original language description

    The article deals with the scintillation secondary electron detector for a variable pressure scanning electron microscope, its electrode system optimization and measurement of the pressure in the detector for different types of pressure limiting apertures.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Student EEICT proceedings of the 17th conference volume 3

  • ISBN

    978-80-214-4273-3

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    402-406

  • Publisher name

    Neuveden

  • Place of publication

    Neuveden

  • Event location

    Brno

  • Event date

    Apr 28, 2011

  • Type of event by nationality

    CST - Celostátní akce

  • UT code for WoS article