Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU89948" target="_blank" >RIV/00216305:26220/11:PU89948 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency

Original language description

Solar cells, or photovoltaic cells, are used to convert sunlight into electrical power. The defects or imperfections in silicon solar cells lower the light-current conversion and consequently also an efficiency of the device. These defects in the semiconductor structure are normally detected by electric measurements. The thermal dependency of breakdown voltage is positive and the defects can be revealed by surface inhomogenity. To ensure a higher quality of the solar cells, advanced local quality assessment is provided and experimental results of solar cell defect measurement in microscale region are presented. Using Near-field optical beam induced current and voltage method, both current and voltage in defect area were detected and individual defectswere localized with higher spatial resolution. This measurement also verifies that in reverse biased electroluminescence spots the quantum efficiency is lower and so these spots affect overall quality of the cell.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GA102%2F08%2F1474" target="_blank" >GA102/08/1474: Local optical and electronic characterisation of optoelectronic structures with nanometric resolution</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2011

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Key Engineering Materials

ISSN

1662-9795

e-ISSN

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Volume of the periodical

465

Issue of the periodical within the volume

1

Country of publishing house

CH - SWITZERLAND

Number of pages

4

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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