Local measurement of solar cell emission characteristics

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU95007" target="_blank" >RIV/00216305:26220/11:PU95007 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Local measurement of solar cell emission characteristics

Original language description

Light emission inspection technique are generally used for the localization of defects. In this paper, the emission comes from reverse biased mono-crystalline solar cells. Firstly, it is demonstrated that light emission of reverse biased solar cells is observable with our system. Experimental data of light emission from cracks, bulk defects, and borders of the cell are presented. Following these measurements, a few scratches were wittingly made on the top side of the solar cell sample and light emissionwas measured again for the same reverse voltage value. A method for distinguishing micro-crack and scratches from recombination centers is also presented. This method is based on detecting light emission intensity while varying the sample temperature, holding the reverse bias level fixed. The light emission data are then correlated with laser beam induced current maps. It is found that there is a different light emission temperature behavior in the case of bulk recombination defects and

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2011

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Proceedings of SPIE

ISSN

0277-786X

e-ISSN

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Volume of the periodical

8036

Issue of the periodical within the volume

8306

Country of publishing house

US - UNITED STATES

Number of pages

6

Pages from-to

"1H1"-"1H6"

UT code for WoS article

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EID of the result in the Scopus database

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