Reverse-biased solar cell light emission thermal dependency

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU89131" target="_blank" >RIV/00216305:26220/10:PU89131 - isvavai.cz</a>

Result on the web

—

DOI - Digital Object Identifier

—

Result language

angličtina

Original language name

Reverse-biased solar cell light emission thermal dependency

Original language description

We present experimental data of light emission measurement from reverse-biased monocrystalline solar cell samples. Using high sensitivity light detection technique (cooled PMT in photon counting regime), some spots appearing in low reverse voltage Ur = 1.9 V have been found. Thermal dependency of light emission from bulk and edge defects shows different characteristics, respectively. Therefore not all of the light emitting spots in visible range are connected with avalanche multiplication or microplasmas. This measurement proves that all defects in the cell are not of the same nature.

Czech name

—

Czech description

—

Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

—

Project

<a href="/en/project/GAP102%2F10%2F2013" target="_blank" >GAP102/10/2013: Fluctuation processes in PN junctions of solar cells</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2010

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Electronic Devices and Systems EDS10

ISBN

978-80-214-4138-5

ISSN

—

e-ISSN

—

Number of pages

4

Pages from-to

—

Publisher name

Novpress

Place of publication

Brno

Event location

Brno

Event date

Sep 1, 2010

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

—