Microholes on the silicon solar cell surface
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU100375" target="_blank" >RIV/00216305:26220/12:PU100375 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Microholes on the silicon solar cell surface
Original language description
Local defects of optoelectronic devices with pn junction affect parameters of whole devices and their quality. For the defects localization purposes the emission of photons from reverse biased devices can be used. Actual results turns out, that those particular light emitting centers can have different physical nature. Some of these defects have indisputable connection with surface morphology, however some not, which makes localization more difficult. In this paper only microholes are investigated. Microscopic localization is not elementary due to small defect size (in submicron range) and low emission intensity. Experimental results are shown and discussed.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
New trends in physics 2012
ISBN
978-80-214-4594-9
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
165-168
Publisher name
Litera Brno
Place of publication
Brno
Event location
Brno
Event date
Oct 11, 2012
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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