Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F17%3APU124381" target="_blank" >RIV/00216305:26220/17:PU124381 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1117/12.2286841" target="_blank" >http://dx.doi.org/10.1117/12.2286841</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2286841" target="_blank" >10.1117/12.2286841</a>
Alternative languages
Result language
angličtina
Original language name
Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence
Original language description
The aim of this research is to detect and localize microstructural defects by using an electrically excited light emission from a forward/reverse-bias stressed pn-junction in thin-film Cu(In; Ga)Se2 solar cells with metal wrap through architecture. A different origin of the local light emission from intrinsic/extrinsic imperfections in these chalcopyrite-based solar cells can be distinguished by a spectrally-filtered electroluminescence mapping. After a light emission mapping and localization of the defects in a macro scale is performed a micro scale exploration of the solar cell surface by a scanning electron microscope which follows the particular defects obtained by an electroluminescence. In particular, these macroscopic/microscopic examinations are performed independently, then the searching of the corresponding defects in the micro scale is rather difficult due to a diffused light emission obtained from the macro scale localization. Some of the defects accompanied by a highly intense light emission very often lead to a strong local overheating. Therefore, the lock-in infrared thermography is also performed along with an electroluminescence mapping
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
<a href="/en/project/LO1401" target="_blank" >LO1401: Interdisciplinary Research of Wireless Technologies</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Photonics, Devices, and Systems VII
ISBN
9781510617025
ISSN
0277-786X
e-ISSN
—
Number of pages
7
Pages from-to
1-7
Publisher name
SPIE
Place of publication
Bellingham, Washington 98227-0010 USA
Event location
Praha
Event date
Aug 28, 2017
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000425429900042