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Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F17%3APU124381" target="_blank" >RIV/00216305:26220/17:PU124381 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1117/12.2286841" target="_blank" >http://dx.doi.org/10.1117/12.2286841</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1117/12.2286841" target="_blank" >10.1117/12.2286841</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence

  • Original language description

    The aim of this research is to detect and localize microstructural defects by using an electrically excited light emission from a forward/reverse-bias stressed pn-junction in thin-film Cu(In; Ga)Se2 solar cells with metal wrap through architecture. A different origin of the local light emission from intrinsic/extrinsic imperfections in these chalcopyrite-based solar cells can be distinguished by a spectrally-filtered electroluminescence mapping. After a light emission mapping and localization of the defects in a macro scale is performed a micro scale exploration of the solar cell surface by a scanning electron microscope which follows the particular defects obtained by an electroluminescence. In particular, these macroscopic/microscopic examinations are performed independently, then the searching of the corresponding defects in the micro scale is rather difficult due to a diffused light emission obtained from the macro scale localization. Some of the defects accompanied by a highly intense light emission very often lead to a strong local overheating. Therefore, the lock-in infrared thermography is also performed along with an electroluminescence mapping

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    <a href="/en/project/LO1401" target="_blank" >LO1401: Interdisciplinary Research of Wireless Technologies</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Photonics, Devices, and Systems VII

  • ISBN

    9781510617025

  • ISSN

    0277-786X

  • e-ISSN

  • Number of pages

    7

  • Pages from-to

    1-7

  • Publisher name

    SPIE

  • Place of publication

    Bellingham, Washington 98227-0010 USA

  • Event location

    Praha

  • Event date

    Aug 28, 2017

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000425429900042