Influence of localized structural defects on the pn junction properties

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26620%2F14%3APU107390" target="_blank" >RIV/00216305:26620/14:PU107390 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.4028/www.scientific.net/KEM.592-593.441" target="_blank" >http://dx.doi.org/10.4028/www.scientific.net/KEM.592-593.441</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.4028/www.scientific.net/KEM.592-593.441" target="_blank" >10.4028/www.scientific.net/KEM.592-593.441</a>

Result language

angličtina

Original language name

Influence of localized structural defects on the pn junction properties

Original language description

Local defects, as micro-fractures, precipitates and other material inhomogeneities in solar cell structure, evidently modify electrical and photoelectrical behavior of the latter. To improve the efficiency and lifetime of existing solar cells, it is important to localize these defects which influence the p-n properties, and assign them corresponding electrical characteristics. Although the electric breakdown can be evident in current-voltage plot, the localization of local defects in the sample, that generate this breakdown, is not so easy task. It has to be done by microscopic investigations and measurement of light emission from defects under electrical bias conditions. Thus to contribute to this end, the structure of defects is microscopically investigated and consequently, the defects can be removed by focused ion beam milling. The experimental results obtained from samples before and after milling are also discussed.

Czech name

—

Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

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OECD FORD branch

20304 - Aerospace engineering

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2014

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Key Engineering Materials (print)

ISSN

1013-9826

e-ISSN

—

Volume of the periodical

592-593

Issue of the periodical within the volume

1

Country of publishing house

CH - SWITZERLAND

Number of pages

4

Pages from-to

441-444

UT code for WoS article

000336694400098

EID of the result in the Scopus database

2-s2.0-84891885669