Identification of Micro-scale Defects in Crystalline Solar Cell Structure

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU101179" target="_blank" >RIV/00216305:26220/12:PU101179 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Identification of Micro-scale Defects in Crystalline Solar Cell Structure
Original language description
The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source inthe reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity. We also focused on thermal degradation in stressed regions. To this aim we used an infrared camera and it turns out that temperature degradation could occur in large scale region compare to micro-scale defects.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Fracture Mechanics for Durability, Reliability and Safety
ISBN
978-5-905576-18-8
ISSN
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e-ISSN
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Number of pages
8
Pages from-to
532-539
Publisher name
Neuveden
Place of publication
Kazaň
Event location
Kazaň
Event date
Aug 26, 2012
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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