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MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU99175" target="_blank" >RIV/00216305:26220/12:PU99175 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    MICRO-SIZED LOCAL DEFECTS ON THE EDGES OF SILICON SOLAR CELLS

  • Original language description

    The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source inthe reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity and optical spectrum.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Electronic Devices and Systems IMAPS CS International Conference 2012

  • ISBN

    978-80-214-4539-0

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    95-100

  • Publisher name

    LITERA

  • Place of publication

    Brno

  • Event location

    Brno

  • Event date

    Jun 28, 2012

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article