MEASUREMENT OF THE TEMPERATURE DEPENDENCE OF COMPLEX PERMITTIVITY AT DIFFERENT FREQUENCIES FOR NIOBIUM OXIDE FILM AT COMMERCIAL ELECTROLYTIC CAPACITORS
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU101494" target="_blank" >RIV/00216305:26220/12:PU101494 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
MEASUREMENT OF THE TEMPERATURE DEPENDENCE OF COMPLEX PERMITTIVITY AT DIFFERENT FREQUENCIES FOR NIOBIUM OXIDE FILM AT COMMERCIAL ELECTROLYTIC CAPACITORS
Original language description
The complex permittivity of thin oxide film in commercial niobium oxide capacitor was measured in the temperature range 218 ? 373 K by using Janis cryostat system, with HP4284A impedance analyzer at frequencies from 20 Hz to 1 MHz. Dielectric relaxationwas observed in the range 218 ? 373 K with the activation energy 0.055 eV. The real part of complex permittivity increases with temperature and decreases with frequency, whereas the imaginary part of complex permittivity displays a broad maximum peak whose position shifts with temperature to a higher frequency region. The measured imaginary parts of complex permittivity of thin oxide film were studied by the graphical analysis of the obtained data as proposed by Havriliak and Negami (HN) equation; we found that HN equation can very well fit the observed dielectric loss as a function of frequency except for slight deviations of observed values from the fitting curve at low frequencies. This slight deviation may be due to dc conductivity.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/ED2.1.00%2F03.0072" target="_blank" >ED2.1.00/03.0072: Centre of sensor, information and communication systems</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
New Trends in Physics, Nové trendy ve fyzice, NTF 2012
ISBN
978-80-214-4594-9
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
27-30
Publisher name
Vysoké učení technické v Brně
Place of publication
Brno
Event location
Brno
Event date
Oct 11, 2012
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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