Thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU87923" target="_blank" >RIV/00216305:26220/12:PU87923 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells
Original language description
The quality and lifetime of solar cells depends critically on both bulk and surface imperfections. When a solar cell is reverse-biased with low voltage, weak emission from imperfections appears. A scanning measurement using a high sensitivity light detection technique utilizing Scanning near-field optical microscope with cooled PMT in the photon counting regime allows non-destructive detection and localization of light-emitting centers originating from imperfections in the cell. We have found that the emission from these imperfections exhibits unique thermal characteristics. As consequence, the thermal characteristics can distinguish among several kinds of imperfections in monocrystalline silicon solar cells.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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