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Investigation of solar cell performance studied by local breakdowns and related noise

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU99055" target="_blank" >RIV/00216305:26220/12:PU99055 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Investigation of solar cell performance studied by local breakdowns and related noise

  • Original language description

    This paper will be dealt with the use of the electrical noise and the specific pn junction breakdowns for solar cells diagnostic purposes. Diffusion technology based pn junctions of the silicon solar cells have been investigated by measurement of electrical noise, transport characteristics and radiation of defect regions in the visible and deep infrared range. Due to the large surface to volume ratio solar cells contain lots of defects that determine the properties of the whole solar cells and introduceloss parameters. Our paper analyses in detail the issue of measuring the electrical noise and fluctuation activity correlated with the optical activity under reverse-biased conditions. Special affords in our research were devoted to finding relations between the specimen IV curves and the noise generated in consequence of the local but also semi-local defects in the solar cell structure.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Electronic Devices ans Systems 2012

  • ISBN

    978-80-214-4539-0

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

    267-272

  • Publisher name

    VUT v Brně

  • Place of publication

    Brno

  • Event location

    Brno

  • Event date

    Jun 28, 2012

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article