Realization of microscale detection and localization of low light emitting spots in monocrystalline silicon solar cells
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F15%3APU112291" target="_blank" >RIV/00216305:26220/15:PU112291 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1117/12.2069504" target="_blank" >http://dx.doi.org/10.1117/12.2069504</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2069504" target="_blank" >10.1117/12.2069504</a>
Alternative languages
Result language
angličtina
Original language name
Realization of microscale detection and localization of low light emitting spots in monocrystalline silicon solar cells
Original language description
We report on detection and localization of imperfections in silicon solar cell bulk and surface with sub-micrometer resolution. To obtain this resolution, a family of imaging techniques including SNOM, SEM and AFM is often separately used for this purpose. In this paper we combine several of these proximal methods together, because each of them brings complimentary information about the imperfection. First, we note that SNOM images often contain distortions due to the interaction of the probe tip and sample. Therefore, we look for the possibility to circumvent this weakness and obtain more realistic images. In our experiments, we take advantage of the fact that defects or imperfections in silicon solar cell structures under reverse-bias voltage exhibit microscale low light emitting spots, and we apply an improved SNOM measurement to localize these spots. As a result, this system allows a localization and measurement of low light emission on microscale. Consequently, the size and shape of imperfections can also be determined.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Proceedings of SPIE
ISSN
0277-786X
e-ISSN
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Volume of the periodical
9450
Issue of the periodical within the volume
9450
Country of publishing house
US - UNITED STATES
Number of pages
7
Pages from-to
„94501O-1“-„94501O-7“
UT code for WoS article
000349404500058
EID of the result in the Scopus database
2-s2.0-84923011988