Assessment of Noise Sources in Resistors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F15%3APU113764" target="_blank" >RIV/00216305:26220/15:PU113764 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Assessment of Noise Sources in Resistors
Original language description
Thermal noise and 1/f noise are investigated at room conditions in three kinds of basic off-the-shelf resistors. Samples of carbon film, metal oxide, and cement fixed wire-wound resistors are evaluated. Measurement setup is created to acquire their noisespectral density. Their Noise Index and Hooge's constant are calculated and their useability in low-noise measurement setup is assessed.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the 21st Student Competition Conference
ISBN
978-80-214-5148-3
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
418-422
Publisher name
Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Place of publication
Brno
Event location
Brno
Event date
Apr 23, 2015
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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