In-situ measurement of total ionising dose induced changes in threshold voltage and temperature coefficients of RADFETs
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F16%3APU121382" target="_blank" >RIV/00216305:26220/16:PU121382 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/document/7747503/" target="_blank" >http://ieeexplore.ieee.org/document/7747503/</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/TNS.2016.2630275" target="_blank" >10.1109/TNS.2016.2630275</a>
Alternative languages
Result language
angličtina
Original language name
In-situ measurement of total ionising dose induced changes in threshold voltage and temperature coefficients of RADFETs
Original language description
This work presents results of a total ionising dose experiment, during which p-channel RADFETs were irradiated and measured under different gate bias conditions using an in-situ technique. The measurement system allowed threshold voltage shifts and temperature sensitivity of the shift to be measured during irradiation to 60 krad(Si) and the subsequent 55 day period of annealing. The experimental results obtained allow improved insight into temperature sensitivity related problems of RADFET based dosimetry systems for space and terrestrial applications. The results show that the radiation-induced decrease in mobility, caused by the interface trap build-up, has a predominant effect on RADFET temperature coefficients.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN
0018-9499
e-ISSN
1558-1578
Volume of the periodical
PP
Issue of the periodical within the volume
99
Country of publishing house
US - UNITED STATES
Number of pages
5
Pages from-to
1-5
UT code for WoS article
000396404500082
EID of the result in the Scopus database
2-s2.0-85015785439