Scale-dependent Choice of Scanning Rate for AFM Measurements

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F18%3APU128466" target="_blank" >RIV/00216305:26220/18:PU128466 - isvavai.cz</a>
Result on the web
<a href="http://www.dpi-proceedings.com/index.php/dtcse/article/view/24197" target="_blank" >http://www.dpi-proceedings.com/index.php/dtcse/article/view/24197</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.12783/dtcse/cnai2018/24197" target="_blank" >10.12783/dtcse/cnai2018/24197</a>

Result language
angličtina
Original language name
Scale-dependent Choice of Scanning Rate for AFM Measurements
Original language description
Three samples with different high of topography features were measured at different scanning rate. We also presented statistical and fractal analyses for definition of the surface morphometrics. They can be used for calculation and evaluation of the images' distortion that takes place during scanning rate and proved to be helpful while controlling the measurement. Basing on the results we came to the conclusion that fractal analysis, the statistical surface roughness parameters and AFM may provide us with a deeper understanding of the physical phenomena taking place in the sample-tip interface. This is why, fractal analysis and statistical surface roughness parameters are useful information for the further improvement of calibration system. This approach can be applied for choosing scanning parameters properly, taking into consideration the geometry of the sample and for the microscope calibration by geometrical sizes of features
Czech name
—
Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
DEStech Transactions on Computer Science and Engineering
ISBN
978-1-60595-065-5
ISSN
2475-8841
e-ISSN
—
Number of pages
7
Pages from-to
453-459
Publisher name
EStech Transactions on Computer Science and Engineering
Place of publication
Neuveden
Event location
Beijing
Event date
Apr 22, 2018
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000468589300071

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