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INFLUENCE OF SCANNING RATE ON QUALITY OF AFM IMAGE: STUDY OF SURFACE STATISTICAL METRICS

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F17%3APU124490" target="_blank" >RIV/00216305:26220/17:PU124490 - isvavai.cz</a>

  • Result on the web

    <a href="http://onlinelibrary.wiley.com/doi/10.1002/jemt.22945/epdf" target="_blank" >http://onlinelibrary.wiley.com/doi/10.1002/jemt.22945/epdf</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1002/jemt.22945" target="_blank" >10.1002/jemt.22945</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    INFLUENCE OF SCANNING RATE ON QUALITY OF AFM IMAGE: STUDY OF SURFACE STATISTICAL METRICS

  • Original language description

    The purpose of this work is to study the dependence of AFM-data reliability on scanning rate. The three-dimensional (3-D) surface topography of the samples with different micro-motifs is investigated. The analysis of surface metrics for estimation of artifacts from inappropriate scanning rate is presented. Fractal analysis was done by cube counting method and evaluation of statistical metrics was carrying out on the basis of AFM-data. Combination of quantitate parameters is also presented in graphs for every measurement. The results indicate that the sensitivity to scanning rate growths with fractal dimension of the sample. This approach allows describing the distortion of the images against scanning rate and could be applied for dependences on the other measurement parameters. The paper explains the relevance and comparison of fractal and statistical surface parameters for characterization of data distortion caused by inappropriate choice of scanning rate.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microscopy research and technique

  • ISSN

    1059-910X

  • e-ISSN

    1097-0029

  • Volume of the periodical

    80

  • Issue of the periodical within the volume

    7

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    11

  • Pages from-to

    1-11

  • UT code for WoS article

    000419168300010

  • EID of the result in the Scopus database

    2-s2.0-85034067831