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CMOS Bi-directional Ultra-wideband Galvanically Isolated Die-to-die Communication Utilizing a Double-isolated Transformer

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F18%3APU134690" target="_blank" >RIV/00216305:26220/18:PU134690 - isvavai.cz</a>

  • Result on the web

    <a href="https://ieeexplore.ieee.org/document/8393609" target="_blank" >https://ieeexplore.ieee.org/document/8393609</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISPSD.2018.8393609" target="_blank" >10.1109/ISPSD.2018.8393609</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    CMOS Bi-directional Ultra-wideband Galvanically Isolated Die-to-die Communication Utilizing a Double-isolated Transformer

  • Original language description

    In this work, an ultra-wideband (UWB) bi-directional galvanic isolator (BDGI) is reported for the first time. The proposed design methodology uses time-division-duplex (TDD) protocol to merge the functionality of two passive galvanically isolated channels into one magnetically coupled communication channel between two chips, enabling up to 50% form-factor and assembly cost reduction while achieving state-of-art performance. A low-power UWB pulse polarity-modulated transceiver architecture is presented to maximize the channel's capacity to 300 Mb/s and minimize power consumption and propagation delay to 200 pj/b and 5 ns respectively. The communication channel utilizes a double-isolated transformer coupled channel consisting of two transformers connected in series using bondwires and achieves 11 kVpk (7.8 kVrms) high voltage isolation, the highest reported without adding extra steps or alternating the native CMOS fabrication process. The system is realized in a 0.25 um BCD (Bipolar-CMOS-DMOS) process with 0.8 mm 2 silicon area per channel. The system uses odd-symmetry center-tapped transformers and differential transceivers to increase noise/transient immunity.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2018

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2018

  • ISBN

    978-1-5386-2927-7

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    88-91

  • Publisher name

    IEEE

  • Place of publication

    Piscataway

  • Event location

    Chicago

  • Event date

    Apr 13, 2018

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article