Noise Measurement of High-Ohm Metal-Oxide Resistors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F26%3A0198073" target="_blank" >RIV/00216305:26220/26:0198073 - isvavai.cz</a>
Result on the web
<a href="https://measurement.sk/M2025/doc/Proceedings-2025.pdf" target="_blank" >https://measurement.sk/M2025/doc/Proceedings-2025.pdf</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.23919/MEASUREMENT66999.2025.11078652" target="_blank" >10.23919/MEASUREMENT66999.2025.11078652</a>
Alternative languages
Result language
angličtina
Original language name
Noise Measurement of High-Ohm Metal-Oxide Resistors
Original language description
This paper deals with the comparison of low-frequency noise of high-ohm metal-oxide resistors and resistors made by thick-layer technology. For measuring very small currents in the order of hundreds of pA to units of fA, a feedback ammeter is very often used, where high-ohm resistors must be connected to the feedback of a precision operational amplifier. Feedback resistors can reach resistance of several hundred GΩ. As the resistance increases, the level of Johnson´s thermal noise also increases. Most high-ohm resistors are manufactured by thick-layer technology that generates also low-frequency flicker noise with a frequency dependence of 1/f. Resistors based on metal-oxide technology should not generate low-frequency flicker noise, but their price is several times higher than the price of resistors made using thick-layer technology.
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
—
OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
—
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2025
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
MEASUREMENT 2025: Proceedings of the 15th International Conference on Measurement
ISBN
978-80-69159-00-6
ISSN
—
e-ISSN
—
Number of pages
4
Pages from-to
40-43
Publisher name
Institute of Measurement Science, Slovak Academy of Sciences
Place of publication
Smolenice Castle, Slovakia
Event location
Smolenice
Event date
Jun 1, 2025
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
001588537200010